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Prof. Dr. Aibin Yan (闫爱斌)

Anhui Provincial Distinguished Young Scholar Fund Receiver (安徽省杰青)

Full Professor and Ph.D. Supervisor with National Demonstrative School of Microelectronics (教授博导)
Director of Institute of Chip Design & Test (所长)
Address: A1802 Sci & Edu Bldg, Danxia 485, Hefei Univ. of Tech., China (合肥工业大学翡翠科教楼A1802)
Contact: abyan@mail.ustc.edu.cn QQ: 10254566

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One latest news: Congratulations to Director Aibin Yan for being selected once again by Stanford University as one of the world's top 2% scientists (2024).
近期新闻一则：祝贺闫爱斌所长2024年再次入选全球前2%顶尖科学家。

Bio（个人简介）

    Dr. Aibin Yan is a Full Professor, PhD Supervisor and "Huangshan" Outstanding Young Scholar, with the National Demonstrative School of Microelectronics, Hefei University of Technology (HFUT), China. In recent years, he received the Outstanding Young Graduate Tutor award in Anhui Province, a Distinguished Young Scholar Fund of Anhui Provincial Department of Education and has been funded by an Outstanding Young Talent Support Program Key Project of Anhui Provincial Universities. In 2021, he established the Anhui University Institute of Chip Design and Test serving as its director. In 2022, he was reported/selected by Stanford University as one of the world's top 2% scientists as well as the only selected scholar of China mainland "211 university" in the field of computer hardware & architecture. He is now an Expert in the Library of both Anhui and Guangdong Provincial Department of Science & Technology of China, a Standing Committee Member on Fault Tolerant Computing as well as Integrated Circuit Design of CCF. He is an Editorial Board Member of IEEE TVLSI and IEEE TCASII, an Editorial Board Member (currently the 2nd person from China mainland) of the Journal of Electronic Testing, and a young Editorial Board Member of the Microelectronics & Computer Journal of China. During 2018.9-2019.9, he visited the WEN Lab, Kyushu Institute of Technology, Japan, under the support of China Scholarship Council (CSC), and under the supervision of Prof. Xiaoqing WEN, an IEEE Fellow, for a full year of time. During that year, he participated in chip design, tape out and test. He is now an IEEE Senior Member, a CCF Distinguished Member and a CIE Tenure Member.
    In recent years, he served as General Chair of the CCF@U & China-Japan (Germany) Bilateral International Workshop on Dependable ICs (1st for CCF TCFTC & TCICD), Program Chair of the 8th IEEE ITC-Asia, Program Chair of the CCF Inspiring Conference & National Advanced IC Technology Conference (1st for CCF CFTC), Session Chair of 52nd IEEE International Symposium on Circuits and Systems (2020), Tutorial+Session Chair and TPC Member of 32nd IEEE Asian Test Symposium (2023), Publicity Chair and TPC Member of 27th IEEE Asian Test Symposium (2018), Session Chair of 5th IEEE International Test Conference in Asia (2021), IEEE ICCAD'25 and IEEE DSN'25 and IEEE ATS/ITC-Asia'25 TPC Member, IEEE EDSSC'25 TPC Member + Topic Chair, Forum Chair of 18th China National Computer Congress (2021), Publicity Chair (and Forum Chair of Fault Tolerance for Commercial Aerospace) of 20th China Fault Tolerance Conference (2023), Session Chair of the 2nd CCF IC Design and Automation Conference, Chair of CCF@U & Aerospace Integrated Circuit Summit Forum, Project Reviewer of National Natural Science Foundation of China, PhD/MSE Dissertation Reviewer of the Degree Center of the Ministry of Education, and Reviewer for IEEE TCAD, IEEE TIE, IEEE TAES, IEEE TETC, IEEE TCASI/II, IEEE TR, IEEE TVLSI, IEEE Tnano, IEEE TDMR, IEEE TNS, ACM TODAES, etc. He presented regular/poster papers for 30+ times in international conferences. He received Best Paper Awards in CCF China Test Conference (2018), IEEE AsianHOST (2022) and IEEE ITC-Asia (2023), a Best Paper Candidate Award in GLSVLSI (2022), the First Prize of Anhui Province Teaching Achievement Award, and a China National Award of "Challenge Cup" Extracurricular Academic and Technological Works Competition as well as an Anhui Provincial Grand-Prize Award (Tutor). In recent years, he served as a supervisor of 28 master students including a PhD candidate and his master students received 20,000 RMB China Scholarship Award in 2020~2023 for 9 times (persons). His master students also received Provincial Outstanding Graduate Award as well as Outstanding Master Thesis Award, Pacemaker for Merit Student Award and Pacesetter for Outstanding Graduate Award. He also guided students to obtain National College Student Innovation and Entrepreneurship Projects to obtain excellent conclusions for several times.
    He published roughly 100+ technical papers in prestigious journals and conferences, such as IEEE TC, TVLSI, TCAD, TETC, TAES, TCASI/II, TR, TDMR, DAC, DATE, ICCD, DSN, ATS, VTS, ISCAS, ITC-Asia. His 10 published papers in IEEE TCAD, TVLSI, TETC and TAES were selected as ESI Highly Cited (Hot) Papers. He presented his research for 30+ times in International Conferences, such as IEEE DAC, DATE, ICCD, DSN, ISCAS, ATS, VTS, DSA, ITC-Asia, etc. He now holds 20 China Patents on fault tolerance of integrated circuits as well as 2 released software copyright about integrated circuit simulations. He was funded by 12 National or Provincial Natural Science Foundation of China as primary investigators for half of them. His research interests include fault-tolerance and test of digital circuits, soft error rate analysis, QCA quantum circuit design, memory design and computing in memory based on new RAMs, and aerospace micro-system design.

Education:
    2002.9-2006.7 B.E degree, Jilin Normal University, Computer Science and Technology major.
    2006.9-2009.7 Master degree, University of Science and Technology of China, Software Engineering major.
    2012.9-2015.12 PhD degree, Hefei University of Technology, Computer Application Technology major.

个人简介（Bio）

闫爱斌博士，合肥工业大学示范性微电子学院教授、博导、黄山学者优秀青年、安徽省杰青和高校优青、安徽省优秀青年研究生导师、安徽大学芯片设计与测试研究所首任所长。2022年入选美国斯坦福大学发布的全球前2%顶尖科学家“年度影响力”榜单，在计算机硬件与系统结构领域为中国大陆211高校唯一的入选学者。担任安徽省/广东省科技厅在库专家、中国计算机学会（CCF）容错计算专委和CCF集成电路设计专委常务委员、CCF B类国际期刊IEEE TVLSI编委、CAA B类国际期刊IEEE TCASII编委、CCF推荐SCI期刊Journal of Electronic Testing编委 (中国大陆唯二）、微电子学与计算机期刊首届青年编委。他于18至19年通过国家公派留学访问日本九州工业大学，师从IEEE会士（院士级别）温晓青教授，参与了芯片设计、流片与测试。现为IEEE高级会员、CCF杰出会员、中国电子学会（CIE）终身会员。
近年来，担任CCF走进高校暨可信集成电路中日（中德）双边国际研讨会大会主席、第8届IEEE国际测试会议亚洲分会程序主席、CCF容错专委首届CCF启智会暨先进集成电路技术大会程序主席、第52届IEEE电路与系统国际会议分会主席、第32届IEEE亚洲测试会议Tutorial主席+会场主席+TPC委员、第27届IEEE亚洲测试会议宣传主席+TPC委员、第5届IEEE国际测试会议亚洲分会分会主席、IEEE ICCAD'25和IEEE DSN'25以及IEEE ATS/ITC-Asia'25 TPC委员、IEEE EDSSC'25 TPC委员+Topic主席、第18届CCF中国计算机大会可信芯片设计与测试论坛主席、第20届CCF全国容错计算学术会议宣传主席/商业航天容错论坛主席、第2届CCF集成电路设计与自动化学会会议分会主席、CCF走进合肥高校暨宇航集成电路高峰论坛总主席、国家自然科学基金项目函评专家、教育部学位中心博士学位论文和留学生学位论文评审专家、12个国际著名期刊IEEE/ACM Trans审稿专家。在国际会议上汇报或展示研究成果30余次，在学术会议CCF CTC'18、IEEE AsianHOST'22、IEEE ITC-Asia'23获得最佳论文奖, 在学术会议ACM GLSVLSI'22获得最佳论文提名奖，在IEEE TCAD/TETC/TVLSI/TAES期刊上发表的论文入选为ESI高被引/热点论文（10篇），获得安徽省教学成果一等奖2项，安徽省“挑战杯”大学生课外学术作品大赛特等奖（国赛三等奖、指导教师）。近四年，指导硕士生9人次（王礼涛、贺玉婷、李志星2次、范整整、陈燕、许哲龙、胡元节、冯祥凤）获得国家奖学金各2万元的资助、指导硕士生获得省级优秀毕业生和优秀硕士论文、校级三好学生标兵和优秀研究生标兵，多次指导本科生获得国家级省级大创项目优秀结题。闫老师的主要研究方向为：数字电路容错与测试、软错误率计算、QCA量子电路设计、基于新型RAM的存储器设计与存算一体、宇航容错微系统设计。

Ph.D. & Master Students (Order by Year desc Name asc; Graduated: No. 1~19)

42.Biying Kang, 41.Changli Hu, 40.Jing Li, 39.Jinpeng Li, 38.Kunming Fan, 37.Yue Zhang, 36.Zikang Ma, 35.Chen Dong, 34.Han Bao, 33.Jiajia Zhang, 32.Kun Li, 31.Wangjin Jiang, 30.Yongkang Xu, 29.Zhiyuan Pei, 28.Zhongyu Gao/PhD, 27.Chao Zhou, 26.Fan Xia, 25.Litao Wang, 24.Xuehua Li, 23.Yang Chang, 22.Yuting He, 21.Zhen Shen, 20.Zhuoyuan Lin, 19.Jing Xiang, 18.Runqi Liu, 17.Shaojie Wei, 16.Yu Chen, 15.Zhen Zhou, 14.Zhixing Li, 13.Aoran Cao, 12.Kuikui Qian, 11.Liang Ding, 10.Zhengzheng Fan, 9.Zhihui He, 8.Yan Chen, 7.Zhelong Xu, 6.Jun Zhou, 5.Xiangfeng Feng, 4.Yuanjie Hu, 3.Kang Yang, 2.Yafei Ling, 1.Zhen Wu.

Funded Projects

Accepted/Publicized Works

Note: CCF and CAA denote China Computer Federation and Chinese Association of Automation, respectively.
----2025----
[] Zhongyu Gao, Aibin Yan, Zhengfeng Huang, Jie Cui, Byeong-hee Roh, Guangzhu Liu, Patrick Girard, and Xiaoqing Wen, "Graph-Based Multi-Task Transfer Learning for Fault Detection and Diagnosis of Few-Shot Analog Circuits," IEEE Internet of Things Journal, Feb. 2025. 中科院大类一区. DOI: 10.1109/JIOT.2025.3547957
[] Aibin Yan, Zhuoyuan Lin, Yongkang Xu, Na Bai, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, and Xiaoqing Wen, "Triple-Node-Upset Recovery High-Impedance-State Insensitive and Single-Event-Transient Filtering Latch for Aerospace Applications," IEEE Transactions on Aerospace and Electronic Systems, 2025, CAA A类. DOI: 10.1109/TAES.2025.3546581
[] Aibin Yan, Chao Zhou, Tianming Ni, Jing Zhang, Jie Cui, Zhengfeng Huang, Patrick Girard, and Xiaoqing Wen, "Cost-Optimized and Highly Robust Latches Providing Complete Quadruple-Node-Upset Tolerance and Recovery with Algorithm based Verifications," IEEE Transactions on Aerospace and Electronic Systems, 2025, CAA A类. DOI: 10.1109/TAES.2024.3525448
[] Aibin Yan, Yuting He, Zhengfeng Huang, Wenjie Yan, Jie Cui, Xiaolei Wang, Tianming Ni, Patrick Girard, and Xiaoqing Wen, "Cost Efficient Flip-Flop Designs with Multiple-Node Upset-Tolerance and Algorithm-based Verifications," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 44, no. 1, pp. 390-394, 2025, CCF A类. DOI: 10.1109/TCAD.2024.3426271
[] Aibin Yan, Changli Hu, Jing Li, Na Bai, Zhengfeng Huang, Tianming Ni, Girard Patrick, and Xiaoqing Wen, "Cost-Optimized Double-Node-Upset-Recovery Latch Designs with Aging Mitigation and Algorithm-based Verification for Long-term Robustness Enhancement," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2025. DOI: 10.1109/TVLSI.2025.3554117
[] Aibin Yan, Yongkang Xu, Yue Zhang, Na Bai, Zhengfeng Huang, Tianming Ni, Patrick Girard, and Xiaoqing Wen, "Design of Nonvolatile and Multinode-Upset Recoverable Latches Based on Magnetic Tunnel Junction and CMOS," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Accept. 2025.
[] Aibin Yan, Zhang Jiajia, Xiumin Xu, Na Bai, Zhengfeng Huang, Wang Xiaolei, Xiaoqing Wen, and Patrick Girard, "TUTPFL: Triple Node Upsets Tolerant and Single Event Transients Filtered Low-Power Latch with HSPICE and FPGA based Verifications," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Major Revision, Mar. 2025.
[] Zhengfeng Huang, Lei Ai, Xinyu Jiang, Xiaolei Wang, Yingchun Lu, Jun Pan, Tai Song, Xiaoqing Wen, and Aibin Yan, "Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Based on Cross-Interlocking," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 44, no. 4, pp. 1595-1608, 2025. CCF A类. DOI: 10.1109/TCAD.2024.3471913
[] Zhengfeng Huang, Xinyu Jiang, Yuqing Zhang, Xiaolei Wang, Yingchun Lu, Jun Pan, Fan Cheng, Xiaoqing Wen, and Aibin Yan, "A Low-Cost Quadruple-Node-Upset Tolerant Latch Design and Recovery Rate Optimization Algorithm," IEEE Transactions on Aerospace and Electronic Systems, 2025, CAA A类. Minor Revision.
[] Tianming Ni, Hao Wu, Mu Nie, Aibin Yan, Senling Wang, Xiaoqing Wen, and Jingchang Bian, "A Response-Non-Linearized DEMUX-TDC PUF for Resistance Against Modeling Attacks and Secure Authentication Protocols," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Major Revision, Mar. 2025.
[] Jingchang Bian, Xingchen Du, Yingchun Lu, Aibin Yan, Huaguo Liang, Zhengfeng Huang, "A chaotic strong transition effect ring oscillator PUF with effective immunity to modeling attacks," Microelectronics Journal, vol. 157, pp. 1-9, 2025. DOI: 10.1016/j.mejo.2025.106592
[] Aibin Yan, Yongkang Xu, Wangjin Jiang, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard, and Xiaoming Chen, "A Novel Multi-Node-Upset Recoverability Verification Method with Generalized Model for Radiation-Hardened Latches," IEEE/ACM Design Automation Conference (DAC2025), pp. 1-7, 2025/6/22-25, San Francisco, USA. CCF A类. Accept.
[] Chen Dong, Aibin Yan, Yue Zhang, Xing Guo, Huaguo Liang, Xiaoqing Wen, Xiaoming Chen, and Patrick Girard, "ACDRL: Aging-mitigated C-elements based Double-node-upset Recoverable Latch for Long-Term Reliability Enhancement," IEEE/ACM Design Automation Conference (DAC2025), pp. 1-7, 2025/6/22-25, San Francisco, USA. CCF A类. Accept.
[] Zhongyu Gao, Aibin Yan, Biying Kang, Chunjiong Zhang, Jehad Ali, Gaoyang Shan, Inam Ullah, and Patrick Girard, "Compound Fault Diagnosis of Analog Circuits for Zero-Shot Learning," IEEE/ACM Design Automation Conference (DAC2025), pp. 1-7, 2025/6/22-25, San Francisco, USA. CCF A类. Accept.
[] Xiaoyu Zhang, Rui Liu, Zerun Li, Aibin Yan, Yinhe Han and Xiaoming Chen, "A Flexible Computing-in-Memory Accelerator for Sparse Matrix-Dense Vector Multiplication," IEEE/ACM Design Automation Conference (DAC2025), pp. 1-7, 2025/6/22-25, San Francisco, USA. CCF A类. Accept.
[] Aibin Yan, Wangjin Jiang, Han Bao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen and Patrick Girard, "NVSRLO: A FeFET-Based Non-Volatile and SEU-Recoverable Latch Design with Optimized Overhead," IEEE Design, Automation and Test in Europe (DATE2025) Conference, accept, 2025/3/31-4/2, Lyon, France. EI, CCF B类.
[] Aibin Yan, Zhiyuan Pei, Xing Guo, Jie Song, Cuiyun Jiang, Huaguo Liang, Xiaoqing Wen, Patrick Girard, "TNURML: Triple-Node-Upset-Recovery Magnetic Latch Design with Non-Volatility for Aerospace Applications," IEEE International Symposium on Circuits and Systems (ISCAS2025), pp. 1-5, 2025/5/25-28, London UK. EI, CCF C类.
[] Mu Nie, ShiDong Zhu, Aibin Yan, Zhuo Chen, Xiaoqing Wen and Tianming Ni, "Efficient Modulated State Space Model for Mixed-Type Wafer Defect Pattern Recognition," IEEE Design, Automation and Test in Europe (DATE2025) Conference, accept, 2025/3/31-4/2, Lyon, France. EI, CCF B类.
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Awards

2024年8月获得CCF推荐国际会议ITC-Asia'23最佳论文奖
2024年4月获得国际期刊IEEE TVLSI 2023年度最佳副编辑
2024年3月获评安徽省优秀青年研究生导师称号
2022年12月获得国际会议AsianHOST'22最佳论文奖
2022年7月获得CCF推荐国际会议GLSVLSI'22最佳论文提名奖
指导学生获得国家奖学金，省(校)级优秀毕业生，校级三好学生(标兵)、优秀研究生标兵
指导学生获得国家级和省级大创项目并获得优秀结题6项
2022年获得安徽省教学成果奖一等奖
2021年获得安徽省教学成果奖一等奖
2021年8月获得安徽大学“三全育人”先进个人荣誉称号
2019年11月获得全国“挑战杯”大学生课外学术科技作品竞赛三等奖（指导教师）
2019年5月获得安徽省“挑战杯”大学生课外学术科技作品竞赛特等奖（指导教师）
2018年8月于中国测试学术会议（哈尔滨）获得最佳论文奖

Teaching

本科生/UnderGrad，C/C++语言程序设计 (2025)
本科生/UnderGrad，数字逻辑电路 (2024-2025)
硕士生/Master，软件工程原理及应用 (2021-2023)
博士生/Ph.D.，"电子信息"学科前沿讲座 (2022)
本科生/UnderGrad，可编程逻辑系统综合设计 (2020-2022)
本科生/UnderGrad，软件工程课程设计/综合实践 (2019-2022)
本科生/UnderGrad，计算机科研方法导论与实践 (2020-2022)
本科生/UnderGrad，数字逻辑课程设计 (2017-2018)

Patents and Software Copyrights

[] 闫爱斌, 李金鹏, 李坤, 李桢旻, 王晓蕾, 倪天明, 黄正峰, "基于多输入反相器的双节点翻转自恢复 SRAM 单元及集成电路", 申请号: 2025102022164
[] 闫爱斌, 包晗, 江王进, 黄正峰, 倪天明, 崔杰, 孟煦, "四种低成本近似CMOS全加器", 申请号: 2024103340969
[] 闫爱斌, 江王进, 包晗, 黄正峰, 倪天明, 崔杰, 孟煦, "基于互反馈C单元的四节点翻转自恢复锁存器", 申请号: 202410333358X
[] 闫爱斌, 李坤, 常杨, 崔杰, 倪天明, 黄正峰, 刘光柱, "基于六列输入分离反相器的抗单粒子双翻转的SRAM单元", 申请号: 2024103326463
[] 闫爱斌, 李雪华, 刘润祺, 崔杰, 倪天明, 黄正峰, "基于新型五输入多数门的QCA电路", 申请号: 202410590566.8
[] 闫爱斌, 项婧, 常杨, 崔杰, 倪天明, 黄正峰, "基于反相器的双节点翻转加固的SRAM单元", 申请号: 2023109328720
[] 黄正峰, 艾磊, 吴文会, 潘俊, 鲁迎春, 梁华国, 黄纪钦, 闫爱斌, 陈新, "一种基于交叉互锁的低开销四点翻转自恢复锁存器," 申请号: 202311119821.2
[] 黄正峰, 孙立霆, 计润五, 张岩, 马东兴, 潘俊, 宋钛, 黄纪钦, 闫爱斌, 倪天明, "一种高性能低功耗的四点翻转自恢复锁存器," 申请号: 202311133714.5
[] 闫爱斌, 夏凡, 位少杰, 申震, 崔杰, 倪天明, 黄正峰, "一种基于七个C单元的双节点翻转自恢复锁存器", 申请号: 202211448884.8
[] 闫爱斌, 位少杰, 李志星, 崔杰, 周勇, 倪天明, 黄正峰, "一种基于循环反馈C单元的三节点翻转自恢复锁存器", 2025.3.13已授权, 202111517128.1
[] 崔宁宁, 李青竹, 崔杰, 仲红, 田苗苗, 闫爱斌, "一种云平台下的安全轨迹相似性查询方法及系统," 2024.4.9已授权, 202111154457.4
[] 闫爱斌, 冯祥凤, 崔杰, 应作斌, 李向前, 温晓青, "一种N-1级故障过滤表决器", 2024.2.5已授权, 201910702101.6
[] 闫爱斌, 钱奎奎, 许哲龙, 崔杰, 倪天明, 宋钛, 黄正峰, "基于C单元的三节点翻转自恢复锁存器", 2022.10.14已授权, 202011112147.1
[] 闫爱斌, 唐锡铭, 周航, 李向前, 周晗, 赵小虎, "一种容忍任意三节点翻转并过滤瞬态脉冲的锁存器", 2022.10.14已授权, 2019108097440
[] 闫爱斌, 胡元节, 陈志立, 许艳, 赵小虎, 温晓青, "一种任意三节点翻转完全自恢复的锁存器", 2022.10.14已授权, 201910218107.6
[] 李锐, 闫爱斌, 路璐, 冯祥凤, 刘思佳, 周俊, "一种任意三节点翻转完全容忍的锁存器," 2022.9.23已授权, 201811556555.9
[] 闫爱斌, 吴珍, 凌亚飞, 杨康, 崔杰, 陈志立, "一种三个内部节点翻转完全免疫的锁存器," 2021.5.25已授权, ZL201810015566X
[] 刘春鸣, 闫爱斌, 黄正峰, 陈旨乐, 何倩, 赖超平, 张银磊, "一种可容忍三节点翻转的锁存器," 2020.11.10已授权, ZL2017112674530
[] 欧阳一鸣, 李胜, 黄正峰, 梁华国, 闫爱斌, 徐秀敏, "无线节点级和无线链路级的拥塞避免模块及其方法," 2019.8.30已授权, 201710060565.2
[] 黄正峰, 彭小飞, 鲁迎春, 梁华国, 易茂祥, 欧阳一鸣, 闫爱斌, "抗单粒子翻转和单粒子瞬态脉冲的锁存器," 已授权, ZL201410398366.9
[] 欧阳一鸣, 何鑫城, 韩君, 易茂祥, 詹文法, 安鑫, 闫爱斌, "片上网络中新颖的故障与拥塞模型下的容错方法," 已授权, ZL201410833884.9

[] 闫爱斌, 曹傲然, 刘润祺, 崔杰, "锁存器仿真源码自动生成软件," 中国软件著作, 2022.4.5已授权, 2022SR1367800
[] 黄正峰, 陈凡, 韩健, 闫爱斌, 梁华国, "电路软错误率分析评估及图形化工具软件," 中国软件著作, 2013.3.20已授权, 2013R11S037277

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